Vladimir Alexandrovich Smirnov
+7(863) 218-40-00
ext.
30104
Senior researcher
Institute of Nanotechnologies, Electronics and Equipment Engineering
Senior researcher
Institute of Nanotechnologies, Electronics and Equipment Engineering
Head of the department
Institute of Nanotechnologies, Electronics and Equipment Engineering
Senior researcher
Academy for Engineering and Technologies
Research interests:
Nanotechnology, nanomaterials, nanoelectronics, micro- and nosystems, scanning probe microscopy, focuced ion beams, nanolithography, carbon nanotubes, oxide nanostructures, memristor, RRAM, bionanotechnology
Research projects:
1. PI of the project N 14-07-31322 «Theoretical and experimental study of the processes of formation and properties of the memristor arrays of nanoscale structures of titanium oxide probe methods nanotechnology" customer Federal State Institution "Russian Foundation for Basic Research".
2. PI of the project "Development and research of the processes of formation and methods Nanodiagnostics memristor structures based on nanocrystalline films of ZnO, vertically aligned carbon nanotubes and titanium oxide nanostructures for making promising elements RRAM», customer "Southern Federal University".
3. co-PI of the project N1936 "Development of theoretical principles and experimental studies of the processes of formation of memristor-based nanostructures titanium oxide and nanocrystalline ZnO films for nonvolatile RRAM elements» in the framework of the basic tasks of the state in the sphere of scientific activities on the instructions number 2014/174, the Ministry of Education and Science of the Russian Federation.
4. co-PI for the project "Development and research techniques of formation of probe sensors for specialized tasks Nanodiagnostics probe by focused ion beams", the Ministry of Education and Science of the Russian Federation, the federal budget in the framework of the federal target program "Scientific and scientific - pedagogical personnel of innovative Russia ".
5. co-PI for the project "Study of the formation and diagnostics based nanobiochips by NBIKS converged technologies for hybrid systems of microfluidics", Ministry of Education and Science of the Russian Federation, the federal budget in the framework of the federal target program "Scientific and scientific - pedagogical personnel of innovative Russia".
6. co-PI for the project "Synthesis of nanostructured layers of oxide materials by magnetron sputtering and pulsed laser deposition under ion stimulation for use as sensitive elements of photodetectors and infrared gas sensors", RFBR.
7. co-PI for the project "The study electrical properties of nanostructured materials based on them and composites for use in gas sensors sensitive elements", SFEDU.
8. co-PI for the project "Research and development of technological bases for the formation of nanostructured films of ZnO and VOx sensors for sensing elements", SFEDU.
9. co-PI for the project N 13317 "Investigation of the control samples and the development of techniques for the measurement of interlaboratory comparative trials to develop methodological component of the infrastructure of the regional branch of metrological maintenance center and conformity assessment of nanotechnology and nanotechnology products in the southern and north- Caucasian Federal Districts ".
10. co-PI for the project N 13316 "Investigation of methods of manufacturing probes for scanning tunneling microscopy and means of metrological provision probe Nanodiagnostics " NT-MDT.
- SCOPUS and WoS publications:
- Polyakova V.V., Smirnov V.A., Ageev O.A. A Study of Nanoscale Profiling Modes of a Silicon Surface via Local Anodic Oxidation // Nanotechnologies in Russia, 2018, Vol. 13, Nos. 1;2, pp. 84;89.
- Smirnov V.A., Tominov R.V., Alyabeva N.I., Ilina M.V., Polyakova V.V., Bykov Al.V., Ageev O.A. Atomic Force Microscopy Measurement of the Resistivity of Semiconductors // Technical Physics, 2018, Vol. 63, No. 8, pp. 1236;1241.
- Tominov R.V., Smirnov V.A., Chernenko N.E., Ageev O.A. Study of the Regimes of Scratching Probe Nanolithography // Nanotechnologies in Russia, 2017, Vol. 12, Nos. 11;12, pp. 650;657.
- Il'ina M.V., Il'in O.I., Blinov Y.F., Smirnov V.A., Kolomiytsev A.S., Fedotov A.A., Konoplev B.G., Ageev O.A. Memristive switching mechanism of vertically aligned carbon nanotubes // (2017) Carbon, 123, pp. 514-524.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85026730303&doi=10.1016%2fj.carbon.2017.07.090&partnerID=40&md5=a7d01925c276b8ba4943dc847ef937c4
- Ageev O.A., Blinov Y.F., Ilina M.V., Ilin O.I., Smirnov V.A. Modeling and experimental study of resistive switching in vertically aligned carbon nanotubes // (2016) Journal of Physics: Conference Series, 741 (1), N 012168.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84989329007&doi=10.1088%2f1742-6596%2f741%2f1%2f012168&partnerID=40&md5=75c89a29e14262ad1f785b32d3d2e08c
- Avilov V.I., Ageev O.A., Konoplev B.G., Smirnov V.A., Solodovnik M.S., Tsukanova O.G. Study of the phase composition of nanostructures produced by the local anodic oxidation of titanium films // (2016) Semiconductors, 50 (5), pp. 601-606.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-4971659093&doi=10.1134%2fS1063782616050043&partnerID=40&md5=70326fae5ebd4a0c87ea71229801df41
- Ageev O.A., Blinov Y.F., Ilina M.V., Ilin O.I., Smirnov V.A., Tsukanova O.G. Study of adhesion of vertically aligned carbon nanotubes to a substrate by atomic-force microscopy // (2016) Physics of the Solid State, 58 (2), pp. 309-314.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84958553160&doi=10.1134%2fS1063783416020037&partnerID=40&md5=e420eede661bceb7c05e2cfc911890a1
- Avilov V.I., Ageev O.A., Jityaev I.L., Kolomiytsev A.S., Smirnov V.A. Investigation of memristor effect on the titanium nanowires fabricated by focused ion beam // (2016) Proceedings of SPIE - The International Society for Optical Engineering, 10224, P. 102240T, .
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85011545495&doi=10.1117%2f12.2267084&partnerID=40&md5=fcbb7a51dfe7eda726ceeeba57a6bddd
- Klimin V.S., Solodovnik M.S., Smirnov V.A., Eskov A.V., Tominov R.V., Ageev O.A. A study of the vertical walls and the surface roughness GaAs after the operation in the combined plasma etching // (2016) Proceedings of SPIE - The International Society for Optical Engineering, 10224, P. 102241Z.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85011589850&doi=10.1117%2f12.2267120&partnerID=40&md5=a2553d0a037b2bf6ad35cfbf1e820116
- Ageev O.A., Balakirev S.V., Bykov A.V., Gusev E.Y., Fedotov A.A., Jityaeva J.Y., Ilin O.I., Ilina M.V., Kolomiytsev A.S., Konoplev B.G., Krasnoborodko S.U., Polyakov V.V., Smirnov V.A., Solodovnik M.S., Zamburg E.G. Development of new metamaterials for advanced element base of micro- and nanoelectronics, and microsystem devices // (2016) Springer Proceedings in Physics, 175, pp. 563-580.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84952056782&doi=10.1007%2f978-3-319-26324-3_40&partnerID=40&md5=8e12d7f6956ef307366d27a0a7f915fc
- Ageev O.A., Bykov A.V., Kolomiitsev A.S., Konoplev B.G., Rubashkina M.V., Smirnov V.A., Tsukanova O.G. Study of modification methods of probes for critical-dimension atomic-force microscopy by the deposition of carbon nanotubes // (2015) Semiconductors, 49 (13), pp. 1743-1748.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84949950172&doi=10.1134%2fS1063782615130023&partnerID=40&md5=044644fff299963fa69dcdee9b43de2e
- Ageev O.A., Ilin O.I., Rubashkina M.V., Smirnov V.A., Fedotov A.A., Tsukanova O.G. Determination of the electrical resistivity of vertically aligned carbon nanotubes by scanning probe microscopy // (2015) Technical Physics, 60 (7), pp. 1044-1050.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84937391219&doi=10.1134%2fS1063784215070026&partnerID=40&md5=4cb3d9daa8f20ddab92648986e168fc2
- Avilov V.I., Ageev O.A., Blinov Y.F., Konoplev B.G., Polyakov V.V., Smirnov V.A., Tsukanova O.G. Simulation of the formation of nanosize oxide structures by local anode oxidation of the metal surface // (2015) Technical Physics, 60 (5), pp. 717-723.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84930226085&doi=10.1134%2fS1063784215050023&partnerID=40&md5=86cd364b51c2355ba859c179ab537599
- Ageev O.A., Blinov Y.F., Ilin O.I., Konoplev B.G., Rubashkina M.V., Smirnov V.A., Fedotov A.A. Study of the resistive switching of vertically aligned carbon nanotubes by scanning tunneling microscopy // (2015) Physics of the Solid State, 57 (4), pp. 825-831.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84928248443&doi=10.1134%2fS1063783415040034&partnerID=40&md5=003f8ab379aef10623f1bdebc2946d02
- Avilov V.I., Ageev O.A., Smirnov V.A., Solodovnik M.S., Tsukanova O.G. Studying the modes of nanodimensional surface profiling of Gallium Arsenide epitaxial structures by local anodic oxidation // (2015) Nanotechnologies in Russia, 10 (3-4), pp. 214-219.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84928777686&doi=10.1134%2fS1995078015020032&partnerID=40&md5=d1b1a6fe5632efd21f61a1efbe4d2c38
- Smirnov V.A. Nanolithography by local anodic oxidation of thin titanium film // (2015) Piezoelectrics and Nanomaterials: Fundamentals, Developments and Applications, pp. 85-103.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84956751997&partnerID=40&md5=ec4373501bfcbc3479fd489c828d0dae
- Ageev O.A., Kolomiytsev A.S., Bykov A.V., Smirnov V.A., Kots I.N. Fabrication of advanced probes for atomic force microscopy using focused ion beam // (2015) Microelectronics Reliability, 55 (9-10), pp. 2131-2134.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84943456250&doi=10.1016%2fj.microrel.2015.06.079&partnerID=40&md5=b3d6720235ded1c3a03b6157473c7762
- Ageev O.A., Alyabieva N.I., Konoplev B.G., Smirnov V.A., Tkachuk V.V. Investigation of the nanodiagnostics probe modes for semiconductor resistivity measurements by atomic force microscopy // (2014) Advanced Materials Research, 894, pp. 374-378.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84903363769&doi=10.4028%2fwww.scientific.net%2fAMR.894.374&partnerID=40&md5=5bd5f49822d80c650641ebc15ace7ec4
- Ageev O.A., Ilin O.I., Kolomiytsev A.S., Rubashkina M.V., Smirnov V.A., Fedotov A.A. Investigation of effect of geometrical parameters of vertically aligned carbon nanotubes on their mechanical properties // (2014) Advanced Materials Research, 894, pp. 355-359.
- Avilov, V.I., Ageev, O.A., Kolomiitsev, A.S., Konoplev, B.G., Smirnov, V.A., Tsukanova, O.G. Formation of a memristor matrix based on titanium oxide and investigation by probe-nanotechnology methods // (2014) Semiconductors, 48 (13), pp. 1757-1762.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84919387246&doi=10.1134%2fS1063782614130028&partnerID=40&md5=6c6996ebd76cf89d9a823b74b2bf188d
- Ageev O.A., Blinov Y.F., Il'in O.I., Kolomiitsev A.S., Konoplev B.G., Rubashkina M.V., Smirnov V.A., Fedotov A.A. Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy // (2013) Technical Physics, 58 (12), pp. 1831-1836.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84890098812&doi=10.1134%2fS1063784213120025&partnerID=40&md5=9f9fb6cbcfdfcf44ab995a033d9a388a
- Ageev O.A., Konoplev B.G., Rubashkina M.V., Rukomoikin A.V., Smirnov V.A., Solodovnik M.S. Studying the effect of geometric parameters of oriented GaAs nanowhiskers on Young's modulus using atomic force microscopy // (2013) Nanotechnologies in Russia, 8 (1-2), pp. 23-28.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84874519201&doi=10.1134%2fS1995078013010023&partnerID=40&md5=b7a7fa959d38818b4d471bf35daf7cf0
- Ageev O.A., Smirnov V.A., Solodovnik M.S., Rukomoikin A.V., Avilov V.I. A study of the formation modes of nanosized oxide structures of gallium arsenide by local anodic oxidation // (2012) Semiconductors, 46 (13), pp. 1616-1621.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84871315617&doi=10.1134%2fS1063782612130027&partnerID=40&md5=57ba904ac1cab111be1362365b2ae6f4
- Ageev O.A., Il'in O.I., Kolomiitsev A.S., Konoplev B.G., Rubashkina M.V., Smirnov V.A., Fedotov A.A. Development of a technique for determining Young's modulus of vertically aligned carbon nanotubes using the nanoindentation method // (2012) Nanotechnologies in Russia, 7 (1), pp. 47-53.
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84857846908&doi=10.1134%2fS1995078012010028&partnerID=40&md5=24586c76eb94f77b2bdada5bc448443b
- Konoplev B.G., Ageev O.A., Smirnov V.A., Kolomiitsev A.S., Serbu N.I. Probe modification for scanning-probe microscopy by the focused ion beam method // (2012) Russian Microelectronics, 41 (1), pp. 41-50. https://www.scopus.com/inward/record.uri?eid=2-s2.0-84862102359&doi=10.1134%2fS1063739712010052&partnerID=40&md5=64a893e4aff4573c9c00c1b9a26fb471
and more.
Teaching:
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Probe nanotechnologies
Teaching students the basics of scanning probe microscopy (scanning tunnel, atomic force, magnetic force, near-field optical microscopy, probe nanolithography); the study of the theoretical foundations of the physics of the interaction of probes with the surface of the materials under study; the study of methods and techniques for the study of various physical properties of the surface of materials by probe methods.
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Methods of analysis and control of nanostructured materials and systems
Discipline is devoted to the study of physical principles, equipment design, methods and techniques for analyzing and controlling the parameters of nanostructured materials, nanoelectronics elements, micro- and nanosystem techniques using scanning probe microscopy.
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Interdisciplinary projects
Preparation and formation of a systematic approach for students in the development and methodology of solving interdisciplinary practical problems in the field of "Electronics and Nanoelectronics".
